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Scanning Electron Microscopy (SEM), Energy Dispersize X-Ray Analyzer (EDS) Technology now in Anaheim, CA
January 10, 2017We are pleased to announce the addition of Scanning Electron Microscopy (SEM) with fully integrated expanded Energy Dispersive X-Ray Analyzer (EDS) at our Anaheim, CA materials testing lab! This capability has been in place at our Baltimore, MD lab for...
Scanning Electron Microscopy (SEM) Capability Expansion at NTS
May 16, 2016NTS Baltimore announces the addition of the new JOEL InTouchScopeTM JSM-6010LA Scanning Electron Microscope (SEM) with fully integrated expanded EDS (energy dispersive X-ray analyzer). This research-grade SEM provides high resolution imaging and a range of acceleration voltages in both...