Scanning Electron Microscopy (SEM), Energy Dispersize X-Ray Analyzer (EDS) Technology now in Anaheim, CA

January 10, 2017

We are pleased to announce the addition of Scanning Electron Microscopy (SEM) with fully integrated expanded Energy Dispersive X-Ray Analyzer (EDS) at our Anaheim, CA materials testing lab! This capability has been in place at our Baltimore, MD lab for...

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Scanning Electron Microscopy (SEM) Capability Expansion at NTS

May 16, 2016

  NTS Baltimore announces the addition of the new JOEL InTouchScopeTM JSM-6010LA Scanning Electron Microscope (SEM) with fully integrated expanded EDS (energy dispersive X-ray analyzer). This research-grade SEM provides high resolution imaging and a range of acceleration voltages in both...

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