We are pleased to announce the addition of Scanning Electron Microscopy (SEM) with fully integrated expanded Energy Dispersive X-Ray Analyzer (EDS) at our Anaheim, CA materials testing lab! This capability has been in place at our Baltimore, MD lab for the past year and clients have been thrilled with the high resolution imaging and range of acceleration voltages provided by this research-grade technology.
For those new to the technology, SEM allows for visual observation of an area of interest in a completely different way from that of the naked eye or even normal optical microscopy. The images generated by the SEM show greater contrast between organic-based and metallic-based materials and thus instantly provide a great deal of information about the area being inspected. Simultaneously, EDS can be used to obtain semi-quantitative elemental results about very specific locations of interest.
Some common uses of SEM and EDS are contamination analysis, solder join evaluation, component defect analysis, inter metallic evaluation, Pb-free reliability, elemental mapping, tin whisker detection, and black pad analysis.