NTS News Center

Latest News in Testing, Inspection and Certification

NTS News Center - Latest News in Testing, Inspection and Certification

Scanning Electron Microscopy (SEM), Energy Dispersize X-Ray Analyzer (EDS) Technology now in Anaheim, CA

We are pleased to announce the addition of Scanning Electron Microscopy (SEM) with fully integrated expanded Energy Dispersive X-Ray Analyzer (EDS) at our Anaheim, CA materials testing lab! This capability has been in place at our Baltimore, MD lab for the past year and clients have been thrilled with the high resolution imaging and range of acceleration voltages provided by this research-grade technology.

For those new to the technology, SEM allows for visual observation of an area of interest in a completely different way from that of the naked eye or even normal optical microscopy. The images generated by the SEM show greater contrast between organic-based and metallic-based materials and thus instantly provide a great deal of information about the area being inspected. Simultaneously, EDS can be used to obtain semi-quantitative elemental results  about very specific locations of interest.

Some common uses of SEM and EDS are contamination analysis, solder join evaluation, component defect analysis, inter metallic evaluation, Pb-free reliability, elemental mapping, tin whisker detection, and black pad analysis.

Click here to learn more about SEM/EDS. Contact our Anaheim, CA or Baltimore, MD lab to discuss your programs today.

Scanning Electron Microscopy (SEM) Capability Expansion at NTS

SEM - Close Up of Fracture Surface, 1000X

SEM – Close Up of Fracture Surface, 1000X

NTS Baltimore announces the addition of the new JOEL InTouchScopeTM JSM-6010LA Scanning Electron Microscope (SEM) with fully integrated expanded EDS (energy dispersive X-ray analyzer).

SEM - Overview of BGA Solder Joint, 90X

SEM – Overview of BGA Solder Joint, 90X

This research-grade SEM provides high resolution imaging and a range of acceleration voltages in both high and low vacuum modes.  The embedded JEOL EDS system with silicon drift detector technology now includes spectral mapping, multi-point analysis, automatic drift compensation, partial area, line scan, and mapping filter functions.  Additionally, the JSM-6010A features simultaneous multiple live image abilities that allows the client to view images remotely with magnifications from 5X – 300,000X.

SEM - Overview of Surface Pitting, 400X

SEM – Overview of Surface Pitting, 400X

“This new “live” capability will allow NTS to work more closely with our clients, allowing them real time access to their analysis from the comfort of their office”, stated Keith Sellers, Operations Manager at NTS Baltimore, adding, “From there, the client can provide immediate instruction as to how the analysis can be focused or how the analysis can be changed to meet their specific need”.

Learn more about the SEM/EDS Analytical Services on our main website or contact us today to discuss your next program.