Event Recap: Telecom Seminar, Best Design Practices and NEBS Workshop

March 28, 2016

On March 8, our Silicon Valley facility hosted its third annual Telecom Seminar: Best Design Practices and NEBS Workshop. The workshop focused on a variety of topics ranging from Environmental Reliability (GR-63 and GR-3108) and EMC (GR-1089), to Multimedia Standards (CISPR-32, KN 32, KN 35) and International Approvals.

Those that attended were able to take advantage of hearing directly from our guest presenter, Todd Talbot with Verizon. As Verizon’s ITL program manager and NEBS Compliance SME, Todd covered various aspects of the NEBS program including its role with compliance, clarifying misconceptions about the requirements, and finished up with highlighting a few hot topics.

In case you missed the event, we are making the presentations available for download!

Topic 1: Testing Pitfalls and Designs – GR-63, ETSI 019, GR-3108

Topic 2: GR-1089 Testing Pitfalls and Designs

Topic 3: Insights on International Approvals

Topic 4: Testing to New Standards – CISPR 32, EN 55032, KN 32, KN 35

Topic 5: Verizon NEBS Requirements

The goal of the Telecom Seminar and NEBS Workshop is to a) address real world design challenges, and b) provide solutions that will help customers streamline their test programs and overall deployment strategies.

The daylong event is broken up into specific topics and are facilitated by both industry and NTS subject matter experts. To learn more about the event, please contact Dean Eriksen at

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