NTS Modernizes and Doubles Capacity for Micro-sectional Analysis of PCBs to MIL-SPEC and IPC Standards

August 21, 2018

The NTS Anaheim, CA laboratory has long been an industry leader in the provision of micro-sectional analysis, the most widely accepted means for analyzing the integrity of printed circuit boards. Continuing this tradition of industry leadership, we have recently modernized...

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Review of the 2017 IPC Reliability Forum

August 16, 2017

The IPC held their inaugural Reliability Forum this April in Chicago and by all accounts, the event was a resounding success! NTS participated along side other industry experts from raw material and equipment suppliers, PCB fabricators, contract manufacturers and OEMs....

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IPC Reliability Forum, April 26-27, 2017 Chicago, IL

March 9, 2017

The IPC Reliability Forum will be taking place on April 26 and 27, 2017 in Chicago at the Hyatt Rosemont.  NTS Vice President Renee Michalkiewicz will be presenting “Fresh Perspective on Test” on Thursday afternoon. To learn more and sign...

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Challenges of Meeting Dynamic Frequency Selection (DFS) Requirements

February 15, 2017

Dynamic Frequency Selection (DFS) requirements for products that operate in certain 5 GHz bands are now firmly established in most regions of the world. DFS is a mechanism that allows sharing of spectrum with radar systems operating in the 5250-5350...

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Scanning Electron Microscopy (SEM), Energy Dispersize X-Ray Analyzer (EDS) Technology now in Anaheim, CA

January 10, 2017

We are pleased to announce the addition of Scanning Electron Microscopy (SEM) with fully integrated expanded Energy Dispersive X-Ray Analyzer (EDS) at our Anaheim, CA materials testing lab! This capability has been in place at our Baltimore, MD lab for...

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Tin Whisker Mitigation Strategies

January 9, 2017

There is no single, perfect strategy for preventing tin whisker formation. Mitigation practices include all sorts of strategies, from heat treatments/annealing, to conformal coatings/potting to matte versus bright tin finishes and others. Check out Keith Seller’s article in the January...

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Shock or Cycling: What’s Right for You?

November 22, 2016

Using functional test on a PCBA after thermal shock to check for PCB failures Thermal Testing (without humidity) is typically broken into 2 categories (Shock and Cycling). Thermal Shock is performed using a 2 chamber system that rapidly moves product...

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Vias for Dummies – the PCB Magazine

November 4, 2016

The via is but one tool that helps in building the wonder that is a printed circuit board, and in this column Keith Sellers discusses the via in relation to the variety of types available for use as well as...

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NTS Volunteers Honored for Contributions to IPC and the Electronics Industry

October 21, 2016

NTS is proud to announce that our own Debora Obitz, Elizabeth Allison, Renee Michalkiewicz, and Russ Shepherd were among the seventy-five individuals who were presented with Committee Leadership, Special Recognition and Distinguised Committee Service Awards at the IPC Fall Standards...

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Does your Product have a Military Application?

September 27, 2016

In this new column in The PCB Magazine, NTS Baltimore General Manager Keith Sellers offers a brief review of the common military testing documents that guide PCBs, printed circuit assemblies, and some electrical components for the critical and often complicated...

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